Unicomp X-Ray-AX9100VS, Multi-mode 3D mikro-fokus sistem deteksi analisis sinar-X

Semikonduktor Elektronik
April 08, 2025
Video Description:
Discover the Unicomp X-ray AX9100vs Multi-mode 3D Micro-focus X-ray Analyze Inspection System, designed for precise detection of tiny defects in BGA, CSP, LED, Flip Chip, automotive components, and more. Featuring multi-mode 3D reconstruction and synchronized 7-axis manipulation, this system ensures high-definition imaging and maintenance-free operation.